M2M ndt phased array for non destructive testing NDT
        M2M do Brasil sistemas phased array industriais END M2M China, M2M ndt phased array products for nondestructive testing NDT M2M Insight KK Japenese non destructive testing phased array products
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phased-array technologies

Electronic Scanning (E-scanning)

Electronic scanning consists of selecting an aperture (number of elements, smaller than the total number of elements of the probe), applying delay-laws to this aperture and move electronically this aperture across the length of the transducer. The operator has to specify the sequencing of the electronic scanning. The number of elements needed for the inspection (aperture), the initial and final number of element to be used are to be specified, along with the electronic step. The operator may select L-wave or S-wave for this technique. The user may combine focusing along with beam steering.

Electronic Scanning (E-scanning)